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The simulation of electronic circuits 1) Considerations for one good circuita simulation them: to) the analyzed behavior it represents only its functionality relatively to puts into effect them stimuli in income b) Every model only has one validity of employment to the inside of sure limits of dimensions, temperature, current, tension c) Often the plan data are originate from procedures di.le which to you do not know the validity d) all the resolutive algorithms are not equally efficient and precise, in some cases they can not converge
2) Criteria for the choice of the model: A model a lot elaborated in kind from place to of the complex equations that carry to a precise result but in a long time regarding that employee for the implementation of a simpler model, is important therefore trade-off between precision and a rapidity of elaboration. In kind then of a same device a various model to second is used that must be used in an analogic circuit or digita them.
3) Model Gradual Channel Approximation for the MOS: We consider a MOS to N channel, it has weakly drugged a P substrate in which drug addicts are realized two N spreads strongly, above the space that separates them is the oxide of Gate a lot until, approximately 1000A°, externally to the spreads we have instead oxide of field a lot often, approximately 5000A°. Over oxide of Gate it comes deposited aluminum to form the electrode of Gate.
4) Distribution of loads in the substrate in function of the tension applied to the gate ones in the case of VDS = 0: to) I accumulate, is had when the tension applied to the Gate recalls from the substrate the majority bearers b) Emptying, is had when the tension applied to the Gate recalls from the substrate a small number of minority bearers only sufficient to compensate the majority bearers c) Reversal, is had when the tension applied to the Gate recalls from the substrate a great number of minority bearers who form therefore a channel between the two spreads, 5) Effect of Vthe DS ¹ 0: To growing of VDS VGD = VGS â?"VDS diminishes until to being smaller of VT to that point from the side of the Drain not is more the reversal of the channel that therefore is obstructed, before the choking the channel is shrunk gradually to growing of VDS and the ID increases more and more slowly, when the channel is choked passes onethe D of independent saturation from Vthe DS , can be had an increase of current of saturation only with an increase of Vthe GS .
6) ideal general Equation that describes the behavior of the MOSFET: The DS is banally where is the resistance of a channel feature dx and is loads for unitary area, replacing third in second and the second one in before it is had , integrating is had from which . This equation evidences three zones of operation: Interdizione is had for VGS< VT , the channel is not formed from the side of the source and therefore current cannot slide Ohmica is had for VDS < (VGS â " VT), of it derives that in the equation pu² to neglect VDS2 . Saturazione is had for VDS > (VGS â " VT) is had in fact thatthe DS is almost independent from Vthe DS .
7) Modulation of channel in the MOSFET: To growing of Vthe DS this is had that the channel is choked and forV elevated DS still more becomes more short, translate in an increase ofthe DS therefore in saturation the MOSFET is not behaved exactly like a current generator, in order to describe the phenomenon it comes used the coefficient of modulation of the length of the channel l and the equation of the MOSFET becomes .
8) Effect of the polarization of the substrate in the MOSFET: The tension of threshold VT is function of the polarization of the substrate, is had in fact . |